Webinar: New PHI Quantes XPS/HAXPES Scanning Microprobe 07/12/17
Join Physical Electronics for a webinar about the new PHI Quantes XPS/HAXPES scanning microprobe on Thursday 7th December 2017 at 8am Chicago time (2pm GMT).
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PHI Quantes XPS/HAXPES Scanning Microprobe
The new PHI Quantes is a lab-based instrument for both:
- Traditional XPS using an Al Kα X-ray source.
- Extended depth of analysis experiments using a Cr Kα (hard) X-ray source – also known as HAXPES (Hard X-ray Photoelectron Spectroscopy).
With a Cr X-ray source, you can analyse your sample around 3 times deeper than with an Al X-ray source. The Quantes is based on technology from Physical Electronics’ established Quantera XPS platform.
The webinar will be presented by Dr. John Newman, Analytical Laboratory Director at Physical Electronics.
Register for the webinar with Physical Electronics’ online form and you’ll receive a link to attend.
The webinar will be on Thursday 7th December 2017 at 8am Chicago time (2pm GMT) and will last 1 hour.
All are welcome to attend – please pass this link on to any colleagues who may be interested.