Webinar: Complementary XPS & TOF-SIMS Surface Analysis 10/01/19
Join Physical Electronics for a webinar about complementary XPS and TOF-SIMS surface analysis on Thursday 10th January 2019 at 10am CST (4pm GMT).
Blue Scientific is the official distributor for Physical Electronics in the UK and Ireland. For more information and quotes, please get in touch:
Complementary XPS and TOF-SIMS
XPS (X-ray Photoelectron Spectroscopy) and TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) are sensitive analytical techniques that can be combined for powerful surface analysis.
This has useful applications in polymers and organic-coated surfaces.
- XPS provides:
- Quantitative analysis
- Short-range bonding chemistry from elements on the outermost surface
- TOF-SIMS gives you:
- Molecular information for identifying organic species
- Spatial resolution to reveal lateral distribution on the sample surface
The webinar will discuss the complementary attributes of XPS and TOF-SIMS, and how they work together to give you a more complete understanding of organic surfaces.
The webinar will be presented by John Newman, Director of Analytical Laboratory at Physical Electronics USA.
Register for the Webinar
Register online on PHI’s website and you’ll receive a link to attend the webinar.
The webinar will be on Thursday 10th January 2019 at 10am Chicago time (2pm GMT) and will last 1 hour.
All are welcome to attend – please pass this link on to any colleagues who may be interested.
XPS and TOF-SIMS Instruments
PHI VersaProbe III
Scanning XPS Microprobe
- Elemental and chemical imaging
- Large and micro area spectroscopy
- Multi-technique test chamber
PHI nanoTOF II
- Parallel imaging MS/MS
- Unambiguous peak identification
- High mass accuracy and resolution
Blue Scientific is the official distributor of Physical Electronics in the UK and Ireland. If you have any questions about these techniques, please get in touch: