Join us for a two day conference in Copenhagen about AFM and nanoscale IR spectroscopy (AFM-IR, s-SNOM and O-PTIR).
Join us as a Sales Engineer for X-Ray Analysis systems in the Nordic region.
Benchtop lubricant screening and materials qualification with a new HFRR module for Bruker’s tribometer.
How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.
How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.
How to analyse layers and coatings with Raman spectroscopy, with the example of paint on coated metal.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
Measuring homogeneity, cleanliness, oxygen content and more for process and quality control in the metals industry.
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
Register now for our Bruker XRD User Meeting on 12-13 June 2019 at Uppsala University in Sweden.