Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
Measuring homogeneity, cleanliness, oxygen content and more for process and quality control in the metals industry.
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
An explanation of helical micro-CT (spiral scanning) and how it’s used in materials science and orthopedic research.
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
Multi-element analysis for refineries and oil manufacturers. Less expensive than WDXRF, with the same analytical performance.
