How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
How mid-IR photothermal spectroscopy opens up infrared to new applications in biology and pharmaceuticals.
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.
Visit us at the annual Nanoscience Days conference in Finland. Talks, poster sessions, exhibition and networking for researchers in the diverse fields of nanoscience and nanotechnology.
Bruker are constantly updating their micro-CT software with new features and capabilities. Round-up of new tools and improvements in CTAn version 1.18.
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
Join Bruker for an SC-XRD webinar about how to collect better structure analysis data with their new IDEAL software module for APEX3.
New Bruker SkyScan 2214 multi-scale nano-CT system, with a large field of view for scanning larger sized objects at ultra-high resolution.