We’re now the official distributor for Bruker Anasys nanoscale infrared spectroscopy & thermal measurement instruments in the Nordic region (Denmark, Sweden, Finland, Iceland & Norway).
EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.
Instrumentation and techniques for studying foam with micro-CT. Analyse the internal structure, map morphometric properties & perform dynamic in-situ experiments (tensile, compression & modified temperature).
Studying tribocorrosion with the Bruker UMT TriboLab tribometer, which combines tribology testing & electrochemical capabilities for measuring open circuit potential (OCP) during wear tests.
How to analyse elemental distribution in rocks with XRF. In this case study we look at columbite-tantalite (coltan) in rocks from Canada, with the Bruker S8 TIGER Series 2 WDXRF… read more →
New Bruker Contour LS-K 3D optical profiler for fast, high quality surface maps and metrology data, with new technology for focus variation on samples with topography.
Bruker NanoElectrical Lab is a package of nanoelectrical AFM techniques, with new DataCube modes. Complete materials characterisation & simultaneous acquisition of mechanical & electrical data. Official Nordic distributor.
Visit us at the Surface Characterisation Conference in Denmark.
The EIGER2 R 500K is a new detector for Bruker XRD systems.