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MicroLED Array Emission Patterns

All About Cathodoluminescence – A New Website from Gatan: WhatisCL.info

Find out all about CL with Gatan’s new website for users and for those new to the technique.

Free Gatan GMS 3 Software

Complimentary Gatan GMS 3 Software During COVID-19 Lab Closures

Download a free copy of Gatan’s electron microscopy software if you’re working from home during COVID-19.

What is 4D STEM?

4D STEM is an electron microscopy technique that captures a full 2D diffraction pattern at each pixel position on a STEM map. Access a wealth of diffraction data with your TEM.

Online Training from Bruker Nano

Online Training from Bruker Nano: AFM, Tribology, Nanoindentation and more

Join Bruker for a series of free online training sessions over the next few weeks, covering nanoscale surface analysis topic.

Nanosclae FTIR and s-SNOM

Advanced 2D Materials Research with Nanoscale FTIR and s-SNOM

A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.

Cryo-EM with the Gatan BioContinuum

Gatan BioContinuum Imaging Filter for Cryo-EM and Cryo-ET

New direct detection system for low-dose, single-particle imaging and cellular organisation and ultrastructure studies.

Coronavirus Mapped with Cryo-EM

Coronavirus Structure Mapped with Cryo-EM

Cryo-EM has been used to generate the first 3D atomic-scale map of the coronavirus (2019-nCoV). This is a key step towards developing a vaccine and treatments for the infection.

Renishaw Correlate Software

Combine Raman with other Microscopy Techniques (SEM, AFM, IR & more)

With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.

ToScA 2020

ToScA 2020: Tomography for Scientific Advancement Symposium (Online Conference)

This year ToScA 2020 is an online, virtual tomography conference on 3rd September 2020 .

Dynamic SIMS: Na in Glass

What is Dynamic SIMS?

An overview of SIMS (Secondary Ion Mass Spectrometry) surface microanalysis, and how dynamic SIMS can be used for bulk composition and in-depth trace element distribution analysis.