New Bruker D8 DISCOVER Plus XRD
The D8 DISCOVER Plus is a powerful new XRD instrument, and the new flagship of the Bruker X-Ray Diffraction range. The system is ideal for high power materials research and analysis of all sample types, from powders to polycrystalline and epitaxial films.
The D8 DISCOVER Plus is the new flagship of Bruker’s XRD range. Its strength lies in the combination of:
- New TXS-HE Turbo X-Ray Source – Highly powerful, efficient and reliable.
- New ATLAS gonoimeter – High endurance and outstanding accuracy.
TXS-HE Turbo X-Ray Source
The TXS-HE X-ray source delivers an extremely high intensity X-ray beam without compromising flexibility. Data collection is much faster than with conventional X-ray sources. This data is also better quality, for new insights into the structural properties of materials. This speed enables you to study dynamic processes, including time dependent phase transitions and kinetics in materials.
The advanced design of the new ATLAS goniometer provides an even higher level of angular positioning accuracy, for more reliable data than ever before. It is extremely robust in all configurations, from classic powder diffraction to epitaxial thin-film characterisation.
The combination of this goniometer with the new X-ray source sets a new standard for laboratory XRD systems.
The D8 DISCOVER Plus offers unmatched capabilities for materials research and analysis:
- 6kW high efficiency Turbo X-ray Source for line and spot focus applications
- Outstanding accuracy of the ATLAS goniometer
- Large detection area and dynamic range of the new EIGER2 R 500K multi-mode Hybrid Photon Counting (HPC) detector
- Three prefigured source-to-sample distances to complement the components, optics and detectors
- Push-button switching between para-focusing Bragg-Brentano for classic methods and parallel beam for capillary measurements and GID.
Configure for your Application
The D8 DISCOVER Plus can be adapted for your sample’s requirements to give you optimal data. Multipurpose configurations are also available for powder diffraction and materials research – contact us for details.
Extract structural information with XRPD, including Rietveld (TOPAS) analysis, diffuse or “total” scattering (PDF analysis), and Small Angle X-Ray Scattering (SAXS).
Thin Film Analysis
Further optimise the incident beam with an additional optic bench position, to balance intensity and resolution.
Maximum Beam Conditioning
A third primary optical bench conditions the beam even further, with a variety of optics including Bartels geometry 4-bounce monochromators.