Up to 100 x 100 x 100 mm
The Bruker M1 MISTRAL is a compact, tabletop micro-XRF analyser for bulk materials, layers and coatings. Analyse a wide range of materials including metals, alloys and multi-layer systems, in electronics, jewellery, RoHS (Restriction of Hazardous Substances), automotives and more.
Up to 100 x 100 x 100 mm
From Z = 22 (titanium) and higher
Detection limits down to 0.01%
Fast and easy to use
Samples are simply placed directly on the sample stage, with no preparation necessary. The contactless measurement is taken from above, so irregular shapes, such as finely wrought jewellery and materials of varying thickness can all be analysed easily.
The high performance version of the M1 MISTRAL can also detect trace elements in light matrices according to RoHS requirements. This enables direct control of hazardous element concentrations in electric and electronic devices.
X-ray fluorescence technology can analyse thin coatings, eg on PCBs, metals or plastics, including both single and multi-layer coatings. Layer thickness and composition are calculated simultaneously, using a standardless fundamental-parameter based method.
The M1 MISTRAL is ideal for the analysis of jewellery, coins and precious metal alloys. The exact composition of jewellery alloys, platinum group metals or silver can be determined in a fraction of a minute. Results can be output either in weight% or Karat. Accuracy is better than 0.2 wt% for main element content in the range of 40 – 100 %.
Lab report – Analysis of pure gold containing traces of other metals
Take a look at our range for metals analysis and process control in production.
Instruments for measuring thin films and coatings.
Bruker webinar about detecting restricted elements and contamination in quality control with the M1 Mistral micro-XRF spectrometer.
Two upcoming webinars from Bruker about analysing coatings and layers with micro-XRF.
An overview of how micro-XRF can help ensure regulatory compliance and how the level of sample preparation impacts data quality and measurement precision.
Recorded webinarHow the Bruker M1 MISTRAL micro-XRF overcomes the limitations of alternative techniques to extend coating analysis performance to the light element range for industrial usage.
Recorded webinar