Join Bruker for a series of free online training sessions over the next few weeks, covering nanoscale surface analysis topic.
Join us for a two day conference in Copenhagen about AFM and nanoscale IR spectroscopy (AFM-IR, s-SNOM and O-PTIR).
How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.
We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with… read more →
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
