New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
An overview of the range of biological microscopy systems from JPK Instruments, now part of Bruker Nano Surfaces.
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
Bruker NanoElectrical Lab is a package of nanoelectrical AFM techniques, with new DataCube modes. Complete materials characterisation & simultaneous acquisition of mechanical & electrical data. Official Nordic distributor.
Visit us at the Surface Characterisation Conference in Denmark.
Join Bruker for an AFM webinar on 15th November 2017 about two unique techniques for in situ, multimodal nanoscale imaging: PeakForce SECM and Force Volume SECM.
Join Bruker for a webinar about how the latest developments in AFM can accelerate research into energy generation and storage.