Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.
The new Gatan Monarc sets new standards for what’s possible with an SEM-based CL detector.
EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.
Webinar about how UC Berkeley Electron Microscope Laboratory used the Gatan Rio camera to image a diverse range of biological sample in a core facility with over 200 users per year.
Data Challenges in Cryo-Electron Microscopy webinar with Gatan on Tuesday 22nd May 2018. How to deal with data storage, transfer and analysis of large data volumes.
Register now for our pre-conference workshop at SCANDEM 2018 for an introduction to Digital Micrograph scripting in Gatan’s Microscopy Suite software for electron microscopes.
An overview of single-particle cryo-electron microscopy. How it works, what it’s used for, advantages of the technique and how to get the highest resolution.
Register now for our pre-conference workshop at SCANDEM 2018 to find out more about high speed TEM with the Gatan OneView camera.
Serial block-face imaging is a 3D imaging technique for life science and materials. How it works, advantages of the technique, applications and example images.