Self-focusing SIMS is a new technique for measuring the composition of semiconductors and SiGE devices. It’s ten times faster than studying nanometre-scale features directly with methods such as TEM or APT.
How researchers at Tohoku University used SIMS (Secondary Ion Mass Spectrometry) in lithium battery research, to measure the lithium diffusion coefficient.
How APT (Atom Probe Tomography) and SIMS can be used in the fields of geology and geoscience, with examples from geochronology, mining and meteorite research.
Atom Probe Tomography (APT) is the only materials analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurement at the atomic scale.
In new research about the origin of water on Earth, SIMS analysis has revealed that enstatite meteorites contain sufficient hydrogen for at least three times the mass of water in… read more →
An overview of SIMS (Secondary Ion Mass Spectrometry) surface microanalysis, and how dynamic SIMS can be used for bulk composition and in-depth trace element distribution analysis.
Blue Scientific is now official distributor for CAMECA elemental and isotopic microanalysis instruments in the UK, Ireland and Finland.