Self-focusing SIMS is a new technique for measuring the composition of semiconductors and SiGE devices. It’s ten times faster than studying nanometre-scale features directly with methods such as TEM or APT.
A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.
The Advanced Materials Show has been postponed to 2-3 December 2020 at NAEC Stoneleigh in Coventry (free to attend).
How to use low dose TEM to study beam-sensitive materials with reduced damage, using new electron counting camera technology.
Achieve the highest lateral and vertical resolution with AcuityXR technology on Bruker’s Contour 3D optical microscopes. Break the optical diffraction limit, without compromising the other benefits of white light interferometry.… read more →
How to analyse microplastic particles with Raman spectroscopy. Identify polymers and measure size, shape and composition with the Renishaw Invia Raman microscope.
New Bruker Contour LS-K 3D optical profiler for fast, high quality surface maps and metrology data, with new technology for focus variation on samples with topography.
Visit us at ASMCS 2016, the Annual Surface and Materials Chemistry Symposium on 8-10 November 2016 in Gothenburg, Sweden.
How to analyse individual and multiple fibres in natural and synthetic materials using micro-CT imaging.