Bruker’s Contact Resonance module is for mechanical characterisation of stiff biological samples, polymers and metals with AFM (Atomic Force Microscopy). Until now it was not possible to study the nanomechanical properties of samples such as teeth, bones, seeds, wood and medical implants with this level of accuracy.
Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.
A new Scanning Electrochemistry option is available for the Bruker JPK NanoWizard BioAFM series. AFM-based SECM is used for electrochemical mapping at nanoscale resolution.
How Atomic Force Microscopy can be used in virology, including measuring biomechanical properties and virus-cell receptor interactions.
The new Bruker Hysitron PI 89 SEM PicoIndenter is an in-situ nanomechanical testing system for electron microscopes, for analysing deformation of high-strength materials.
Lund University in Sweden recently published two scientific papers about studying defects in GaN nanowires and structures, using AFM and various complementary techniques.
Join Bruker for a series of free online training sessions over the next few weeks, covering nanoscale surface analysis topic.
A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.
Register now for Bruker Hysitron’s nanomechanicel testing conference and user meeting on 4-6 February 2020 in Düsseldorf, Germany.