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Category Archive for ‘X-Ray Analysis’

Bruker IDEAL

Improved SC-XRD Models with Bruker IDEAL (Invariom Derived Electron AnaLysis)

How to achieve better crystallography models with IDEAL, part of Bruker’s APEX3 SC-XRD software, compared to standard IAM (Independent Atom Model).

Bruker SC-XRD Detectors

Upgrade your SC-XRD Detector: Bruker PHOTON II for D8 QUEST and D8 VENTURE

Upgrading the detector on your SC-XRD system can enhance the performance your instrument for faster acquisition, higher quality data and lower running costs. Here’s an overview of the latest PHOTON II CPAD detector, available for the Bruker D8 QUEST and D8 VENTURE Single Crystal X-Ray Diffraction systems, as well as SMART APEX and KAPPA APEX. They’re available with […]

Bruker XRD Non-Coplanar Arm

High-Intensity In-Plane Diffraction with the Bruker D8 DISCOVER Plus XRD

Acquire the best quality data with the highest intensity, with a new non-coplanar arm and X-ray optics for the Bruker D8 DISCOVER Plus XRD.

Bruker D8 DISCOVER Plus

Analysing Thin Films and Coatings with X-Ray Reflectometry

Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.

XRD Reciprocal Space Mapping

Large Area Reciprocal Space Mapping of Thin Films with XRD

Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and film reflections and accurate peak intensities. Blue Scientific is the official distributor for Bruker XRD in Norway, Sweden, Denmark, Finland and Iceland. For more information […]

Metals Analysis

Metals Analysis with OES (Optical Emission Spectrometry)

Measuring homogeneity, cleanliness, oxygen content and more for process and quality control in the metals industry.

Microanalysis in Geology

Micro-Diffraction vs Standard Powder XRD in Geology

With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.

Uppsala, Sweden

Bruker XRD User Meeting – Sweden, 12-13 June 2019

Register now for our Bruker XRD User Meeting on 12-13 June 2019 at Uppsala University in Sweden.

Bruker Nordic Service

Official Service Partner for Bruker AXS and Nano Surfaces (Nordic Region)

We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with a team of service engineers based regionally across the Nordic countries.  Bruker X-Ray Analysis  Bruker Nano Surface Analysis  Contact us on +44 (0)1223 422 269 […]

Coal Power Plant

Detecting Impurities in Coal, Coke and Carbon Products with WDXRF

Trace element detection and analysis with WDXRF, for power plants, metal production and other industrial processes.