Webinars: Coatings Analysis with Micro-XRF

Coatings Analysis with Micro-XRF Webinars

Learn more about coatings analysis with micro-XRF with these webinars from Bruker. There will be two webinars:

  • Wednesday 4th May 2016
    Automated Analysis of Decorative and Functional Coatings
  • Thursday 12th May 2016
    Spatially Resolved Layer Thickness Analysis of Thin Metal Coatings

All are welcome to attend. Each webinar will take place twice, so you can pick the most convenient time.

Blue Scientific is the exclusive distributor of Bruker Micro-XRF in the UK and Ireland, so if you have any questions, please get in touch:

 Contact us on 01223 422 269 or info@blue-scientific.com

 View Micro-XRF instruments


  

Coatings analysis with micro-XRF

Automated Analysis of Decorative and Functional Coatings with the M1 MISTRAL Micro-XRF Spectrometer

Wednesday 4th May 2016
Duration: 1 hour

Micro-XRF spectrometry is an established method for non-destructive elemental analysis of coatings. Automated multiple point analysis is ideal for  quality control and process monitoring of coated systems with repeating patterns, such as edge connector contacts on PCBs, or where there are many  intricate parts, such as chain links in jewellery.

This webinar will cover:

  • Automated analysis along the sample stage, using new XSpect Pro software
  • Measuring the thickness and composition of multiple layers, and evaluating the data.
  • Programming regular point patterns and transferring them onto similar structures using reference points.
Bruker XSpect Pro software

Automated coating analysis with Bruker XSpect Pro software

In the webinar, coatings on electronic parts will be used as an example, but micro-XRF is extremely flexible and can be used for a wide range of sample types, including coatings in the automotive and jewellery industries. The instrument used in the example is the M1 MISTRAL micro-XRF spectrometer.

At the end of the session there will be a Q&A session, giving you the opportunity to discuss your queries with the speakers.

Speakers

  • Dr. Max Buegler, Applications Specialist, Bruker Nano Analytics
  • Falk Reinhardt, Application Scientist Micro-XRF, Bruker Nano Analytics

Who should attend?

  • Quality control specialists working with electronics, automotive and jewellery.
  • Coating quality control technicians responsible for quality assurance and failure analysis in industrial manufacturing.

Register

The date of this webinar has now passed, but you can still watch a recorded version:

 Download the slides

 Watch the recorded version

Coating thickness analysis with micro-XRF

Spatially Resolved Layer Thickness Analysis of Thin Metal Coatings with Micro-XRF

Thursday, 12 May 2016
Duration: 1 hour

  • Session I – 8 am GMT, 10 am CEST, 4 pm CST, 6 pm JST – Register now
  • Session II – 8 am PDT, 11 am EDT, 12 pm SAET, 5 pm CEST – Register now

The content of both sessions is identical.

When applying coatings in production processes, the thickness of coatings and the composition of deposited films are highly important. Micro-XRF can be used to analyse coating composition and layer thickness, using point measurements and distribution maps of coated areas.

This webinar will cover:

  • Spatially resolved distribution analysis of coatings
  • Using software to generate layer models
  • The results will be compared with calibration standards, to demonstrate precision and reproducibility
  • Question and answer session

The instrument used in the webinar will be the Bruker M4 TORNADO micro-XRF spectromer, along Bruker’s XMethod coating analysis software.

Element distribution analysis

Element distribution of Sn, Br, Au, Bi, Cu, Ni, and Si on a printed circuit board (memory module).

The focus will be on metallic coatings on different substrates, for applications such as Au/Pd/Ni on copper on a printed circuit board (PCB) and metallic coatings on glass. However, micro-XRF is extremely flexible and is used in a huge variety of industries. If you are unsure whether the technique would be suitable for your application, please get in touch.

Speakers

  • Samuel Scheller, Sr. Product Manager Micro-XRF, Bruker Nano Analytics
  • Falk Reinhardt, Application Scientist Micro-XRF, Bruker Nano Analytics

Who should attend?

  • Quality control specialists, measuring the thickness and composition of thin metal coatings in the electronics industry
  • Quality control technicians responsible for quality assurance and failure analysis in coating services for PCBs
  • Researchers in R&D

 Register for the webinar

 View Micro-XRF instruments

 Contact us on 01223 422 269 or info@blue-scientific.com