Webinar: Identify Crystal Domains with Micro-XRF – 14/07/16

Spatially Resolved Crystal Domain Identification:
Laue Mapping with the M4 TORNADO Micro-XRF Spectrometer

Join Bruker for a live webinar on Thursday 14th July 2016 about how to identify crystal domains with micro-XRF. There will be two sessions, both with the same content:

  • Session I: 8 am GMT, 10 am CEST, 4 pm CST, 5 pm JST – Register here
  • Session II: 8 am PDT, 11 am EDT, 12 pm SAET, 5 pm CEST – Register here

Blue Scientific is the official distributor for Bruker Micro-XRF in the UK – if you have any questions or would like a demonstration, please get in touch.

 More about Micro-XRF

 Contact us on +44 (0)1223 422 269 or info@blue-scientific.com


  

Identifying diffraction peaks with micro-XRF

Diffraction peaks in a GaNdO3 crystal

Diffraction Peaks

Diffraction peaks are often seen as inconvenient artefacts that interfere with XRF data. However, they are related to crystal orientation and can provide extra, useful information about your sample.

Identifying Crystal Domains

The webinar will cover:

  • How to identify high and low angle grain boundaries, as well as twin boundaries, in crystalline materials.
  • Gathering information about crystals, including size and distribution.
  • Measuring diffraction peaks.
  • Identifying crystal domains in crystalline materials.

At the end of the webinar there will be a 15 minute Q&A session.

Identifying crystal domains with micro-XRF

Spatial distribution of crystal domains in a polycrystalline silicon wafer

This new approach uses micro-XRF for fast measurement, covering the whole sample area with high spatial resolution. It is suitable for a variety of materials, including polycrystalline silicon wafers, aluminum samples and welding joints.

While this technique does not provide information about single crystal orientation, it can identify single crystalline grains. The detection and visualisation of grains and subgrains provides useful information about the micro-structure. This is important when evaluating the quality of single crystals, and when describing the characteristics of polycrystalline materials.

Who should attend?

  • Quality control specialists assuring quality single crystal growth procedures
  • Researchers in R&D

Speakers

  • Dr. Roald Tagle, Senior Micro-XRF Application Scientist, Bruker Nano Analytics
  • Falk Reinhardt, Micro-XRF Application Scientist, Bruker Nano Analytics

Register for the Webinar

The live webinar will be on Thursday 14th July 2016. There will be two sessions, both with the same content. The webinar is free – simply register on Bruker’s website to receive a link to attend:

  • Session I: 8 am GMT, 10 am CEST, 4 pm CST, 5 pm JST – Register here
  • Session II: 8 am PDT, 11 am EDT, 12 pm SAET, 5 pm CEST – Register here

If you can’t make it to the live webinar, register to receive a link to watch a recording.

Bruker M4 TORNADO

The instrument used in the webinar is the Bruker M4 TORNADO, a benchtop micro-XRF spectrometer that can be used to analyse virtually any kind of inorganic, organic, irregularly-shaped or even liquid sample. More about the M4 TORNADO…

Blue Scientific is the official distributor for Bruker Micro-XRF in the UK – if you have any questions or would like a demonstration, please get in touch.

 More about Micro-XRF

 Contact us on +44 (0)1223 422 269 or info@blue-scientific.com

Bruker Tornado Micro-XRF

Bruker M4 TORNADO micro-XRF spectrometer