SEM-EDS can be used to characterise the composition of polymer composites. This is useful in failure analysis, to detect and identify contaminants and defects, and to check homogeneity.
Map defect distribution and variations for process development of materials for electronic / optoelectronic devices. CL is ideal for materials not suitable for photoluminescence spectroscopy.
The EIGER2 R 250K is an HPC (Hybrid Photon Counting) pixel detector for the Bruker D8 ADVANCE and DISCOVER XRD systems.
How SEM/EDS is used in failure analysis of steel, with examples of bend test failures, coating defects and corrosion in the automotive industry.
Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.
This year there have already been three scientific publications featuring the breakthough techniques of O-PTIR and IR + Raman.
Empty modelling identifies components and unknown materials from complex mixtures, even without knowledge of the species present.
Self-focusing SIMS is a new technique for measuring the composition of semiconductors and SiGE devices. It’s ten times faster than studying nanometre-scale features directly with methods such as TEM or APT.
Join us for a 2 hour online workshop on Wednesday 14th April 2021 at 1pm BST / 2pm CEST about how O-PTIR is being used in biological applications.
Total Materia is the most comprehensive database of materials, with >540,000 materials from 63 countries and >350,000 metal alloys. It’s fully integrated into Bruker’s OES software for PMI, grading and advanced metals analysis.