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Physical Electronics (PHI)


Physical Electronics XPS, Scanning Auger & TOF-SIMS

XPS, TOF-SIMS and scanning Auger surface analysis instruments for chemical characterisation, nano-scale feature analysis and thin films. Official distributor in the UK and Ireland.

 Contact us on 01223 422 269 or



Scanning Auger (AES)

PHI 710 Scanning Auger nanoprobe


PHI nanoTOF II TOF-SIMS spectrometer

About Physical Electronics

Physical Electronics XPS

Physical Electronics is a leading supplier of TOF-SIMS, XPS and Auger surface analysis instruments for surface chemical characterisation, nano-scale feature analysis and thin film characterisation.

XPS (X-Ray Photoelectron Spectroscopy), also known as ESCA (Electron Spectroscopy for Chemical Analysis) is a widely used surface analysis technique that is easy to use, with relatively simple data interpretation. 

XPS provides information about surface layers and thin film structures, which is invaluable in industrial applications including polymer surface modification, catalysis, corrosion, adhesion, semiconductor and dielectric materials, electronics packaging, magnetic media and thin film coatings.

Why Choose Physical Electronics?

  • Global leader in surface analysis
  • Focussed on enabling next generation technologies
  • Over 40 years experience
  • Contact us

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