Bruker D8 DISCOVER
X-Ray Diffraction & Scattering
The most versatile and flexible XRD Solution.
The Bruker D8 DISCOVER perfectly matches the requirements of research, development and quality control in industry and academia.
Benefits
Details
The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.
Applications:
- Phase Identification and quantification, structure determination and refinement, Micro strain and crystallite size analysis,
- X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis
- Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS),
- Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF), Small Angle X-Ray Scattering (SAXS)
Get in Touch
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