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Renishaw InVia

Renishaw Raman

Renishaw inVia Raman Microscope

Research-Grade Confocal Raman Microscope

The Renishaw inVia is easy to use, delivering outstanding performance and reliable results. Acquire detailed chemical images and highly specific Raman data from discrete points. Analyse both large volumes and minute traces of material.

Perform all types of Raman measurements:

  • Time series – How your sample alters over time
  • Temperature ramps – Phase changes with a hot/cold cell
  • Line scans – Profile your sample across the surface or into its depth
  • Area mapping – Horizontal images at fixed focus across the topography, or vertical slices. More details…
  • Volume scans – 3D views of your transparent sample’s internal structure
  • Transmission mapping – Analyse large volumes of material and produce depth-averaged 2D images of bulk material homogeneity
  • Specialist measurements – Trigger data collection from your own equipment (eg control system on a synchrotron beamline)
  • Identify components in mixtures – With the new Spectrum Search software module.
  • Automated particle analysis – With a dedicated software module.

The easy-to-use software allows you to collect the data you need, analyse and display it as you want to.

Learn more about Raman in our recorded webinar…

Combine Raman with AFM to reveal a wealth of nanoscale information – more details…

Combine with nanoindentation for chemical and mechanical datamore details…

Contact us for more information and quotes:
+44 (0)1223 422 269 or

Renishaw inVia

Renishaw inVia Raman brochure Raman Spectroscopy explained



  • Powerful, reliable and easy to use
  • Automate common tasks to save time
  • Highly sensitive and unambiguous
  • Flexible – choose lasers, optical components and accessories
  • Combine with AFM: inVia AFM-Raman
  • Combine results with other microscopy techniques with Renishaw’s Correlate software – more info…

inVia Models

The range includes three models, from the entry level inVia Basis to the flagship inVia Qontor:

Sample Viewing

  inVia Basis inVia Reflex inVia Qontor
Stereo viewing (binocular eyepieces)  optional
Memorised and automatic post collection viewing  –
Software microscope control  –
Automatic white light/Raman switching  –
Automatic white light saving with data  –
Combined white light and laser video viewing  –
White light auto-focus (LiveTrack)  –

Data Collection

inVia Basis inVia Reflex inVia Qontor
Automated measurement queuing

Automatic focus tracking (LiveTrack)

Alignment and Performance Checks

inVia Basis inVia Reflex inVia Qontor
Internal neon wavelength calibration source

Internal reference standards for auto-calibration

Automated Raman calibration correction (quick calibration)

Laser auto-align

Raman signal auto-align

Performance health check

High Quality, Reliable Spectra

Acquire reliable, repeatable data easily, and determine key information from your sample. Reveal not just Raman bands, but also other features such as photoluminescence bands.

Raman spectra

Raman spectrum of l-histidine, showing lattice modes, fingerprint and C-H range. Taken from a single spectral collection.

Wide Range of Samples

Analyse a whole range of samples easily:

  • Highly sensitive – Study weak Raman scatterers, thin films and tiny particles
  • Sampling options – For small and large samples
  • Optional polarisation kits – For crystalline samples. Orientate or scramble polarisations of both the laser and analyser.

High Quality Results

  • SynchroScan™ technology ‑ gets you the entire spectrum at high resolution, without artefacts.
  • High spectral resolution ­‑ easily identify materials (even chemically similar polymorphs) and monitor material stress
  • Stable ‑ your results are repeatable and reliable
  • Background correction ‑ automatically remove fluorescent backgrounds

Simplicity and Speed

Collect data quickly and automatically:

  • Highly efficient system
  • Line focus option – reduces laser power density, to prevent damage. Keep your signal levels up and acquire data rapidly.
  • Data analysis options ‑ extract the information you need from your spectra
  • Adjustable spatial resolution ‑ switch from sub-micro-metre high-resolution measurements to large scale averaging of bulk samples
  • Store and re-use your measurement configurations


Raman spectra of Azithromycin

Raman Images

Raman images reveal spatial information about materials and their properties. Create images to show the spatial relationship of sample variation:

  • Different materials, forms and compositions
  • Distribution and size of chemical species
  • Relative amounts within mixtures
  • Stress and strain
  • Crystal quality

Images can be taken across the sample’s surface, or as vertical slices or 3-dimensional images, displaying chemical information in new ways.

Imaging Techniques

  • Large area mapping – more details…
  • Fast, high resolution mapping
  • Surveying for known materials
  • Sloping and uneven surfaces

Combine with Other Microscopy Techniques

Overlay Raman images with results from other microscopy systems including SEM, AFM, infrared, fluorescence and optical microscopy. Renishaw’s Correlate software module makes it easy to combine your data for powerful insights. More info…

Raman image of washing powder

White light and Raman images of washing powder

Volume Analysis

Determine detailed chemical and property information from volumes. Suitable for samples transparent to lasers and Raman signals.

  • Presence and size of biological features eg nucleus and organelles within cells
  • Inclusion size and shape within gemstones, glass and other transparent solids
  • Variation in layer thickness of films egpolymer laminates and multi-layer coatings
  • Distribution and size of droplets in emulsions
  • Structure of foams and other delicate materials that cannot be touched
  • Complex stress fields within transparent solids eg diamond

Overcome Refraction Issues

Refraction at interfaces can compromise the quality of volume images. The inVia has immersion objectives and cover-slip corrected objectives to reduce refraction, maintain confocality, and improve performance when looking deep into samples.

The software also corrects refractive index differences. The depth scale can be altered to reflect the true depth, rather than apparent depth.

3C-SiC Core Inclusion (Raman Image)

3D Raman image of 3C-SiC core inclusion, showing: 3C-SiC inclusion (red); 4H-SiC epilayer (green); 4H-SiC substrate (blue). The pipe-like structure is sub-surface and difficult to locate using other techniques. Courtesy of Prof. Noboru Ohtani, Kwansei Gakuin University, Japan.

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