Renishaw inVia Raman Microscope
Research-Grade Confocal Raman Microscope
The Renishaw inVia is easy to use, delivering outstanding performance and reliable results. Acquire detailed chemical images and highly specific Raman data from discrete points. Analyse both large volumes and minute traces of material.
Perform all types of Raman measurements:
- Time series – How your sample alters over time
- Temperature ramps – Phase changes with a hot/cold cell
- Line scans – Profile your sample across the surface or into its depth
- Area mapping – Horizontal images at fixed focus across the topography, or vertical slices. More details…
- Volume scans – 3D views of your transparent sample’s internal structure
- Transmission mapping – Analyse large volumes of material and produce depth-averaged 2D images of bulk material homogeneity
- Specialist measurements – Trigger data collection from your own equipment (eg control system on a synchrotron beamline)
- Identify components in mixtures – With the new Spectrum Search software module.
- Automated particle analysis – With a dedicated software module.
The easy-to-use software allows you to collect the data you need, analyse and display it as you want to.
Learn more about Raman in our recorded webinar…
Combine Raman with AFM to reveal a wealth of nanoscale information – more details…
Combine with nanoindentation for chemical and mechanical data – more details…
Contact us for more information and quotes:
+44 (0)1223 422 269 or info@blue-scientific.com
Renishaw inVia Raman brochure Raman Spectroscopy explained
inVia Models
The range includes three models, from the entry level inVia Basis to the flagship inVia Qontor:
Sample Viewing
inVia Basis | inVia Reflex | inVia Qontor | |
Stereo viewing (binocular eyepieces) | optional | ||
Memorised and automatic post collection viewing | – | ||
Software microscope control | – | ||
Automatic white light/Raman switching | – | ||
Automatic white light saving with data | – | ||
Combined white light and laser video viewing | – | ||
White light auto-focus (LiveTrack) | – | – |
Data Collection
inVia Basis | inVia Reflex | inVia Qontor | |
Automated measurement queuing |
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Automatic focus tracking (LiveTrack) |
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Alignment and Performance Checks
inVia Basis | inVia Reflex | inVia Qontor | |
Internal neon wavelength calibration source | – |
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Internal reference standards for auto-calibration |
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Automated Raman calibration correction (quick calibration) |
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Laser auto-align |
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Raman signal auto-align |
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Performance health check | – |
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High Quality, Reliable Spectra
Acquire reliable, repeatable data easily, and determine key information from your sample. Reveal not just Raman bands, but also other features such as photoluminescence bands.

Raman spectrum of l-histidine, showing lattice modes, fingerprint and C-H range. Taken from a single spectral collection.
Wide Range of Samples
Analyse a whole range of samples easily:
- Highly sensitive – Study weak Raman scatterers, thin films and tiny particles
- Sampling options – For small and large samples
- Optional polarisation kits – For crystalline samples. Orientate or scramble polarisations of both the laser and analyser.
High Quality Results
- SynchroScan™ technology ‑ gets you the entire spectrum at high resolution, without artefacts.
- High spectral resolution ‑ easily identify materials (even chemically similar polymorphs) and monitor material stress
- Stable ‑ your results are repeatable and reliable
- Background correction ‑ automatically remove fluorescent backgrounds
Simplicity and Speed
Collect data quickly and automatically:
- Highly efficient system
- Line focus option – reduces laser power density, to prevent damage. Keep your signal levels up and acquire data rapidly.
- Data analysis options ‑ extract the information you need from your spectra
- Adjustable spatial resolution ‑ switch from sub-micro-metre high-resolution measurements to large scale averaging of bulk samples
- Store and re-use your measurement configurations

Raman spectra of Azithromycin
Raman Images
Raman images reveal spatial information about materials and their properties. Create images to show the spatial relationship of sample variation:
- Different materials, forms and compositions
- Distribution and size of chemical species
- Relative amounts within mixtures
- Stress and strain
- Crystal quality
Images can be taken across the sample’s surface, or as vertical slices or 3-dimensional images, displaying chemical information in new ways.
Imaging Techniques
- Large area mapping – more details…
- Fast, high resolution mapping
- Surveying for known materials
- Sloping and uneven surfaces
Combine with Other Microscopy Techniques
Overlay Raman images with results from other microscopy systems including SEM, AFM, infrared, fluorescence and optical microscopy. Renishaw’s Correlate software module makes it easy to combine your data for powerful insights. More info…

White light and Raman images of washing powder
Volume Analysis
Determine detailed chemical and property information from volumes. Suitable for samples transparent to lasers and Raman signals.
- Presence and size of biological features eg nucleus and organelles within cells
- Inclusion size and shape within gemstones, glass and other transparent solids
- Variation in layer thickness of films egpolymer laminates and multi-layer coatings
- Distribution and size of droplets in emulsions
- Structure of foams and other delicate materials that cannot be touched
- Complex stress fields within transparent solids eg diamond
Overcome Refraction Issues
Refraction at interfaces can compromise the quality of volume images. The inVia has immersion objectives and cover-slip corrected objectives to reduce refraction, maintain confocality, and improve performance when looking deep into samples.
The software also corrects refractive index differences. The depth scale can be altered to reflect the true depth, rather than apparent depth.

3D Raman image of 3C-SiC core inclusion, showing: 3C-SiC inclusion (red); 4H-SiC epilayer (green); 4H-SiC substrate (blue). The pipe-like structure is sub-surface and difficult to locate using other techniques. Courtesy of Prof. Noboru Ohtani, Kwansei Gakuin University, Japan.
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