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Posts Tagged ‘afm’

Nanofluidics & AFM

Single Cell Experiments with the Cytosurge FluidFM and Bruker JPK BioAFM

The Cytosurge FluidFM is now available fully integrated into Bruker JPK BioAFMs. This enables single cell experiments, including adhesion measurement, injection, nano-printing and more.

Nordic AFM Days 2019

Nordic AFM Days 2019

Join us for a two day conference in Copenhagen about AFM and nanoscale IR spectroscopy (AFM-IR, s-SNOM and O-PTIR).

Bruker JPK NanoWizard 4 BioAFM

Bruker JPK NanoWizard 4 XP: High Resolution, Large Format Bio-AFM

The Bruker JPK NanoWizard 4 XP is a new, high resolution, large format biological AFM system

Fast AFM

Fast AFM with the Bruker Dimension FastScan

How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.

Bruker Nordic Service

Official Service Partner for Bruker AXS and Nano Surfaces (Nordic Region)

We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with a team of service engineers based regionally across the Nordic countries.  Bruker X-Ray Analysis  Bruker Nano Surface Analysis  Contact us on +44 (0)1223 422 269 […]

NEW Bruker Dimension-XR Scanning Probe Microscopes

New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.

Bruker AFM-nDMA

NEW: Viscoelastic AFM Measurements matching Bulk DMA (AFM-nDMA)

New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.

JPK Instruments (Bruker Nano)

Biological AFM and Microscopy Systems from JPK Instruments / Bruker

An overview of the range of biological microscopy systems from JPK Instruments, now part of Bruker Nano Surfaces.

KPFM AFM

High Resolution KPFM with Bruker PeakForce KPFM

How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).

Bruker PeakForce TUNA AFM

Nanoscale Electrical and Mechanical Property Mapping with AFM

How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.