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Posts Tagged ‘afm’

PeakForce Tapping with Bruker AFM Microscopy

High Resolution AFM with Bruker PeakForce Tapping

PeakForce Tapping enables high resolution imaging and extends AFM to areas not previously possible. Map nanoscale properties simultaneously alongside imaging.

AFM Workshop 2016, Denmark

AFM Workshop: Latest Developments in SPM, 17/03/16, Denmark

Come to our AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark.

PeakForce Tapping

Webex Training: Nano-Electrical Characterisation Calibration Parameters and Best Practice

Join Bruker for a live remote webex training session about nano-electrical calibration calibration procedures and best practice, on Monday 8th February 2016 at 10 am (CET time).

Blue Scientific now represents Bruker Nano Surfaces in Norway, Sweden, Denmark and Finland

Blue Scientific is now the exclusive representative of Bruker Nano Surfaces, for sales of atomic force microsopy (AFM), stylus and 3D optical profilometers and tribology and mechanical testing products in Sweden, Denmark, Norway and Finland. All enquiries relating to sales of Bruker Nano Surfaces products in the Nordic region should now be directed to Blue […]

What is AFM-IR Video

AFM-IR Video: Anasys nanoIR2

AFM-IR Video AFM-IR is a pioneering nanoscale surface analysis technique that combines AFM (atomic force microscopy) with infrared (IR) spectroscopy. Watch the AFM-IR video from Anasys for an easy-to-understand, visual explanation of what AFM-IR is and how the technique captures spectra alongside AFM-IR images. nanoIR2™ AFM-IR System The Anasys nanoIR2 is a nanoscale IR spectroscopy platform. The system features […]

AFM-IR Webinar - nanoscale IR spectroscopy for materials and life science

AFM-IR Webinar, 21st October: Nanoscale IR Spectroscopy for Materials and Life Science

AFM-IR webinar about nanoscale IR spectroscopy for materials and life science, presented by Anasys Instruments on Tuesday 21st October at 8am PST (4pm GMT). Learn about revolutionary AFM-IR surface analysis technique and why it is being adopted as the new method of choice for nanoscale chemical identification and composition mapping. With sub-50nm spatial resolution, AFM-IR is an entirely […]

Anasys AFM-IR Workshop

Anasys AFM-IR Workshop – Tuesday 4th November

Join us at our Anasys AFM-IR Workshop on Tuesday 4th November 2014 at the University of Manchester School of Materials. The event will include: Presentations from leading researchers in the field of AFM-based nano IR measurements Live demonstrations on an Anasys AFM-IR system Unique opportunity to meet the inventor of AFM-IR: Dr. Alex Dazzi of the Université Paris-Sud […]

ECOSS Surface Science Conference

ECOSS: European Conference on Surface Science

ECOSS, the 30th European Conference on Surface Science, will be taking place on 31 August – 05 September 2014. The conference venue is the Kervansaray Lara Convention Centre in Antalya on the Mediterranean coast of Turkey. The event will include talks and poster sessions, with prizes for the best presentations, as well as a gala dinner. The talks and […]