Self-focusing SIMS is a new technique for measuring the composition of semiconductors and SiGE devices. It’s ten times faster than studying nanometre-scale features directly with methods such as TEM or APT.
How APT (Atom Probe Tomography) and SIMS can be used in the fields of geology and geoscience, with examples from geochronology, mining and meteorite research.
In new research about the origin of water on Earth, SIMS analysis has revealed that enstatite meteorites contain sufficient hydrogen for at least three times the mass of water in the oceans. The research at CRPG Nancy (Research Center Pétrographiques Et Géochimiques) in France used SIMS technology from CAMECA. Blue Scientific is the official distributor […]
An overview of SIMS (Secondary Ion Mass Spectrometry) surface microanalysis, and how dynamic SIMS can be used for bulk composition and in-depth trace element distribution analysis.
