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Posts Tagged ‘ebic’

Automated Cross-Sections with the Gatan PECS II

Automated Cross-Sections, Polishing and Delayering for SEM / Optical Microscopy

Prepare high quality samples for SEM, EDS, EBSD, cathodoluminescence, EBIC and more with the Gatan PECS II broad argon beam system.

Tom Warwick electron microscopy
EBIC (Electron-Beam Induced Current)

What is EBIC? (Electron-Beam Induced Current)

EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.

Stephen Badger electron microscopy
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