A new fully-integrated system from Gatan and DECTRIS provides low-voltage capabilities for electron counting on EELS, EFTEM and energy-filtered 4D STEM over the entire 30 – 300 kV voltage range.
Study changes in composition and the electronic structure at the nanoscale with in-situ EELS in your TEM.
European EELS and EFTEM School with Gatan, on 6-9 February 2018 at Graz University of Technology in Austria. Learn to acquire and analyse EELS data.
We are delighted to add Gatan to our portfolio of scientific instruments, for our Nordic customers. Gatan systems enhance the performance of electron microscopes.