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Posts Tagged ‘electrical characterisation’

Bruker PeakForce TUNA AFM

Nanoscale Electrical and Mechanical Property Mapping with AFM

How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.

EBIC (Electron-Beam Induced Current)

What is EBIC? (Electron-Beam Induced Current)

EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.