Posts Tagged ‘electron microscopy’

Join us for a workshop at the University of Copenhagen, with live demos on the Gatan Rio camera.

Join us for a demo of the Gatan PECS II (Precision Coating & Etching System) in Sweden on 6-10 May 2019. Sample preparation for SEM, SPM & optical microscopy.

Cathodoluminescence (CL) is a technique for characterising composition, optical and electronic properties with data that correlates with morphology, micro-structure, composition and chemistry at the nanoscale.

Visit us at the annual SEMT electron microscopy meeting in London on 12th December 2018.

Lunchtime talk about cryo-EM at the University of Copenhagen on Tuesday 30th October 2018.

Join Bruker for a webinar on 18 October 2018 about in-situ nanomechanical testing in the TEM, including how to observe materials under stress at the nanoscale.

Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.

Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.

The new Gatan Monarc sets new standards for what’s possible with an SEM-based CL detector.

EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.