A series of video tutorials demonstrating how to use Gatan’s IS player, part of GMS 3 (Gatan Microscopy Suite) software for TEM/SEM.
The new Bruker Hysitron PI 89 SEM PicoIndenter is an in-situ nanomechanical testing system for electron microscopes, for analysing deformation of high-strength materials.
Upgrading your TEM camera can update your existing microscope for higher quality data, faster and easier workflows and convenient new features.
How to use low dose TEM to study beam-sensitive materials with reduced damage, using new electron counting camera technology.
Study changes in composition and the electronic structure at the nanoscale with in-situ EELS in your TEM.
Join Bruker for a webinar on 18 October 2018 about in-situ nanomechanical testing in the TEM, including how to observe materials under stress at the nanoscale.
Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.
Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.