A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.
The Advanced Materials Show has been postponed to 2-3 December 2020 at NAEC Stoneleigh in Coventry (free to attend).
How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
Study changes in composition and the electronic structure at the nanoscale with in-situ EELS in your TEM.
How to characterise multilayer films at sub-micron resolution with infrared, using O-PTIR spectroscopy.
How to analyse microplastic particles with Raman spectroscopy. Identify polymers and measure size, shape and composition with the Renishaw Invia Raman microscope.
Visit our booth at the Nordic Additive Manufacturing Show in Copenhagen.
Serial block-face imaging is a 3D imaging technique for life science and materials. How it works, advantages of the technique, applications and example images.
New flagship of the Bruker XRD range, with powerful components for materials research and analysis.
Visit us at Imperial College London at the Department of Materials Postdoctoral Symposium on Friday 8th September 2017. View our range of instruments Contact us on +44 (0)1223 422 269 or… read more →