Map defect distribution and variations for process development of materials for electronic / optoelectronic devices. CL is ideal for materials not suitable for photoluminescence spectroscopy.
Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.
We’re proud to announce a new partnership with Thermo Fisher Scientific as official industrial distributor of the Axia ChemiSEM scanning electron microscope in the UK and Ireland.
Find out all about CL with Gatan’s new website for users and for those new to the technique.
4D STEM is an electron microscopy technique that captures a full 2D diffraction pattern at each pixel position on a STEM map. Access a wealth of diffraction data with your TEM.
With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.
Celebrating the 10th anniversary of PeakForce Tapping, the fastest growing AFM mode.
Prepare high quality samples for SEM, EDS, EBSD, cathodoluminescence, EBIC and more with the Gatan PECS II broad argon beam system.
Achieve the highest lateral and vertical resolution with AcuityXR technology on Bruker’s Contour 3D optical microscopes. Break the optical diffraction limit, without compromising the other benefits of white light interferometry.… read more →