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Posts Tagged ‘nanoscale analysis’

Scientific Nanoscale Analysis Podcast

“Solutions for NanoAnalysis” Podcast

A new nanoanalysis podcast from Bruker, with special guests from all areas of nanoscale analysis including micro-XRF, TXRF, nanomechanical testing, TEM/SEM and more.

Bruker Anasys nanoIR3-s Broadband

New Bruker nanoIR3-s Broadband Nanoscale IR and SNOM/AFM Microscopy System

The Bruker nanoIR3-s Broadband is the most advanced s-SNOM based nanoscale FTIR spectroscopy system available, with the broadest spectral range, high resolution nanochemical and nano-optical imaging capabilities.

Nordic AFM Days 2019

Nordic AFM Days 2019

Join us for a two day conference in Copenhagen about AFM and nanoscale IR spectroscopy (AFM-IR, s-SNOM and O-PTIR).

Bruker AcuityXR Optical Microscope

Highest Resolution 3D Optical Microscope: Bruker Contour with AcuityXR

Achieve the highest lateral and vertical resolution with AcuityXR technology on Bruker’s Contour 3D optical microscopes. Break the optical diffraction limit, without compromising the other benefits of white light interferometry. For a limited time, we currently have a trade-in offer to help you benefit from the latest 3D optical microscope technology. Trade in your surface […]

Cathodoluminescence Image

What is Cathodoluminescence? Plus how to add it to your SEM/TEM/STEM

Cathodoluminescence (CL) is a technique for characterising composition, optical and electronic properties with data that correlates with morphology, micro-structure, composition and chemistry at the nanoscale.

NTNU Trondheim

ENRIS 2017 & NNUM 2017 – 8-10 May 2017

Visit us at ENRIS 2017 (European Nanofabrication Research Infrastructure Symposium) on 8-9 May and NNUM 2017 (Nordic Nanolab User Meeting) on 9-10 May at the NTNU in Trondheim, Norway.