SEM-EDS can be used to characterise the composition of polymer composites. This is useful in failure analysis, to detect and identify contaminants and defects, and to check homogeneity.
How nanoscale infrared spectroscopy can be used to measure semiconductor materials in defect and contamination analysis, and fabrication.
Polymer analysis webinar about using AFM-IR (nanoscale IR spectroscopy) and related problem solving techniques. The webinar is on Thursday 11th December 2014 at 4pm GMT, and is hosted by Anasys… read more →