Empty modelling identifies components and unknown materials from complex mixtures, even without knowledge of the species present.
Renishaw’s Spectrum Search is a new software feature that automates the process of identifying components within a mixture with Raman spectroscopy.
The Renishaw inVia InSpect is a new version of Renishaw’s inVia confocal Raman microscope, optimised specifically for use in forensic laboratories for trace chemical analysis.
With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.
How the Geological Survey of Finland (GTK) used Raman spectroscopy to study graphitisation temperature and measure graphite crystallinity, relevant to battery development.
The Renishaw Virsa Raman Analyser has probes for remote analysis, so you can measure samples outside your microscope and the lab.
How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
Simultaneous infrared and Raman Microscopy – a world first, using the mIRage IR microscope from Photothermal Spectroscopy Corp.
How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.
How to analyse layers and coatings with Raman spectroscopy, with the example of paint on coated metal.