The Renishaw inVia InSpect is a new version of Renishaw’s inVia confocal Raman microscope, optimised specifically for use in forensic laboratories for trace chemical analysis.
With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.
How the Geological Survey of Finland (GTK) used Raman spectroscopy to study graphitisation temperature and measure graphite crystallinity, relevant to battery development.
The Renishaw Virsa Raman Analyser has probes for remote analysis, so you can measure samples outside your microscope and the lab.
How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.
How to analyse layers and coatings with Raman spectroscopy, with the example of paint on coated metal.
How Raman spectroscopy is used in the development of photovoltaics and solar cells.
Unique features from Renishaw for mapping large areas quickly and at high resolution with Raman spectroscopy.
Identify battery materials, produce maps and correlate composition and structure with device performance with Raman and AFM-Raman.