An overview of SIMS (Secondary Ion Mass Spectrometry) surface microanalysis, and how dynamic SIMS can be used for bulk composition and in-depth trace element distribution analysis.
Achieve the highest lateral and vertical resolution with AcuityXR technology on Bruker’s Contour 3D optical microscopes. Break the optical diffraction limit, without compromising the other benefits of white light interferometry.… read more →
New Bruker Contour LS-K 3D optical profiler for fast, high quality surface maps and metrology data, with new technology for focus variation on samples with topography.
Visit us at the Surface Characterisation Conference in Denmark.
The amount of sliding friction between two surfaces is affected by a number of factors, one of the most obvious being surface texture. But how exactly does the roughness or… read more →
New nano-scratch option for the Bruker NanoForce nanomechanical testing system, for nanoscale scratch testing.
Visit our stand at the UK Surface Analysis Forum Winter Meeting on 06/01/17 in Brighton.
Blue Scientific is now an official distributor for Renishaw Raman Microscopy in the Nordic region (Denmark, Sweden, Finland, Norway and Iceland).
Visit us at UKSAF 2016 in Dublin, a surface analysis conference organised by the UK Surface Analysis Forum.
Register now for a Tribology Testing and Metrology Workshop on Thursday 16th June 2016 in Finland, at NORDTRIB 2016. See live demos of the Bruker UMT TriboLab and Contour Optical Microscope.