Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.
How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
How to characterise multilayer films at sub-micron resolution with infrared, using O-PTIR spectroscopy.
Traditional material characterisation techniques (eg tensile testing) are not always reliable at the nanoscale. True nanoscale sensitivity and the capacity for quantitative analysis are key to understanding the structure and properties of nanoscale… read more →
Testing Thin Films and Coatings with the Bruker UMT TriboLab Test the material properties of thin films and coatings with the Bruker UMT TriboLab. Perform a wide variety of mechanical tests… read more →