How to achieve better crystallography models with IDEAL, part of Bruker’s APEX3 SC-XRD software, compared to standard IAM (Independent Atom Model).
Acquire the best quality data with the highest intensity, with a new non-coplanar arm and X-ray optics for the Bruker D8 DISCOVER Plus XRD.
Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
Register now for our Bruker XRD User Meeting on 12-13 June 2019 at Uppsala University in Sweden.