Automated characterisation, verification and classification
The Thermo Scientific Phenom ParticleX TC is a versatile desktop SEM for technical cleanliness at the microscale. Perform high-quality in-house characterisation, verification and classification of materials.
It’s simple to operate and fast to learn, opening up particle and material analysis to a wider group of users.
Automated characterisation, verification and classification
Faster than outsourcing
With minimal training
Compliant with industry standards
SEM can analyse smaller particles than light microscopy, which is now necessary in many industries including automatives. As well as automated SEM, the Phenom ParticleX TC also offers EDS (Energy-Dispersive X-ray Spectroscopy) for chemical classification of the particles. This provides extra insights in production processes and environments.
Standard reports compliant with VDA 19 / ISO 16232 or ISO 4406/4407 are available. You can run standard recipes
or specify parameters such as particle size range, chemical classification rules, area of interest and stop criteria. Reports can be exported, and particles can be revisited for further analysis.
An optional secondary electron detector (SED) is available for collecting low-energy electrons from the top surface layer. This is useful where topography and morphology are important, revealing detailed surface information about microstructures, fibres and particles.
The user interface is based on Thermo Scientific’s established Phenom desktop SEM range, which is designed to be easy to use, making SEM more accessible. Both existing and new SEM users need only minimal training to be up and running and acquiring high quality images and data.
You can perform both element mapping and line scans. Line scans display the quantified element distribution in a line plot; especially useful with coatings, paints and multiple layers for analysing edges, coatings and cross-sections.
An on-demand webinar from Thermo Scientific:
A recorded webinar from Thermo Scientific about how to match the features and specification of a SEM to the requirements of your application.
