Atomic Force Microscope with Extra Analytical Features
The Anasys afm+ is a powerful, full-featured AFM with powerful analytical capabilities that make it much more than just an imaging tool. It’s easy to set up and use, for faster time to results, even for new users.
- All common imaging modes
- High resolution closed loop imaging with excellent noise performance
Powerful Nanoscale Analysis
- Thermal analysis with patented ThermaLever probes
- Wideband nanomechanical analysis with Lorentz Contact Resonance mode
- Nanoscale IR spectroscopy upgrade option for local chemical composition analysis
- Premounted cantilevers for fast, easy alignment
- Motorised sample stage and high quality optics for rapid analysis area location
- Fast time to results, even for new users
AFM+ Thermal Analysis
Nanoscale Thermal Analysis (nano-TA)
Using thermal probe technology, the afm+ delivers transition temperatures from any local feature of the sample, as well as transition temperature maps.
AFM image and nano-TA data of a toner particle, embedded in epoxy and microtomed. The topography shows variations in structure, which can then be analysed using nano-TA. Toner particles include various components (wax, resin, dye, etc.) with different transition temperatures.
Scanning Thermal Microscopy (SThM)
This mode enables mapping of relative thermal conductivity and temperature differences across the sample.
4µm x 8µm scanning thermal microscopy (SThM) image of a carbon fibre–epoxy composite sample. The sample was cut and polished for a smooth surface. The height image (left) shows a number of carbon fibres, while the SThM image (right) shows the change in probe temperature on the two materials, due to their different thermal conductivity. This illustrates the high lateral-resolution capability of SThM.
Transition Temperature Microscopy
Transition temperature microscopy (TTM) is a fully automated mode, in which an array of nano-TA measurements are taken rapidly, with each temperature ramp is analysed automatically, to determine the transition temperature.
Optical image and TTM map of a banded spherulite composed of poly (L-lactic acid) (PLLA). The TTM map was created using the motorised XY stage. The blue areas are amorphous PLLA; the red and yellow areas are crystalline. The “onion-like” structure in the spherulite was created by stepping the temperature back and forth during crystallisation to create regions with a higher or lower degree of crystallinity. Courtesy of J. Morikawa, Tokyo Institute of Technology.
AFM + Mechanical Imaging
The mechanical properties of a sample can be determined using contact resonance, which maps stiffness variations simultaneously with topography.
4µm x 8µm topography image and stiffness map of a three-component polymer blend. The stiffness map measures the variation in modulus by analysing the contact resonance of the cantilever, which clearly resolves the three materials.
Multifunctional Nanoscale Measurement Suite
The afm+ is fully upgradeable to Anasys Instruments’ nanoIR system, a probe-based measurement tool that uses infrared spectroscopy to reveal nanoscale chemical composition. The nanoIR also delivers high-resolution characterisation of local topographic, mechanical and thermal properties. Application areas include polymers, materials science and life science, including structure-property correlation research.
Multi-property measurement using the nanoIR system. The sample is a multilayer film consisting of polyethylene and polypropylene. The two materials can be distinguished clearly by their unique absorption bands. The difference in stiffness and transition temperature can also be measured.
Upgradeable Analytical Capabilities
The afm+ is fully upgradeable to Anasys’ nanoIR system, for analysing nanoscale chemical composition with infrared spectroscopy. You can then characterise local topographic, mechanical and thermal properties. This is useful in polymers, materials science and life science, for studying the relationship between structur and properties.
AFM + IR Spectroscopy
- Point-and-click nanoscale IR spectroscopy
- IR spectra correlating with FTIR libraries
- Chemical imaging